Electron Optic Services, Inc.
70 Bentley Ave; Suite 205.
K2E 6T8 CANADA
Phone (613) 723-7773
Fax (819) 684-2308
This system, updated for 2003, offers the most cost effective capability for analysis of
Cathodoluminescence(CL) materials. A unique fibre optic interface allows
accurate light alignment on fine grain samples for optimum collection efficiency.
The detector geometry allows for simultaneous high resolution imaging in both secondary(SE)
backscatter BSD and CL Modes. The spectrometer is a high sensitivity 2048 element CCD with
selected grating optimized for 360-1000nm spectral coverage. A unique spectrometer
window capability when used with the 4PI Revolution Digital Control System allows for
compositional mapping of selected spectral elements. Offering full spectral analysis plus the
ability to produce high resolution imaging via a super high sensitivity photomultiplier, interfaced to the fibre
optics, the EOS CL System is a unique tool for the microanalyst.
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